@techreport{weko_183958_1,
   author	 = "Yucong,Zhang and Stefan,Holst and Xiaoqing,Wen and Kohei,Miyase and Seiji,Kajihara and Jun,Qian",
   title	 = "On Avoiding Test Data Corruption by Optimal Scan Chain Grouping",
   year 	 = "2017",
   institution	 = "Kyushu Institute of Technology, Kyushu Institute of Technology, Kyushu Institute of Technology, Kyushu Institute of Technology, Kyushu Institute of Technology, Advanced Micro Devices, Inc.",
   number	 = "17",
   month	 = "oct"
}