@inproceedings{weko_144803_1,
   author	 = "一二三,潤 and 曽根崎,詠二 and 山口,潤己 and 古田,潤 and 小林,和淑",
   title	 = "28 nm UTBB FD-SOIプロセスにおけるα線照射による低電圧動作時のFFのソフトエラー耐性評価",
   booktitle	 = "DAシンポジウム2015論文集",
   year 	 = "2015",
   volume	 = "2015",
   number	 = "",
   pages	 = "47--52",
   month	 = "aug"
}