@inproceedings{weko_128002_1,
   author	 = "山元,浩幸 and 橘田,光弘 and 松尾,俊彦",
   title	 = "大規模ASICのテスト設計手法とバウンダリスキャン適用事例",
   booktitle	 = "全国大会講演論文集",
   year 	 = "1995",
   volume	 = "第50回",
   number	 = "ハードウェア",
   pages	 = "93--94",
   month	 = "mar"
}